Thin film and coating thickness measurement systems using non-contact optical technology.

Remanufactures and upgrades Estek, ADE and Tencor wafer inspection tools, produces latex sphere calibration standards, type gauges and particle deposition systems.

Manufacturer of Semiconductor Thin Film Thickness Measurement Systems, capable of measuring oxide; nitride; polysilicon; photoresist; CIE color; CMP; Endpoint; and Color Filter by using UV, VIS, NIR, Spectrometer. Automatic and Compact models are available.

Two Hot New Products !!! SMD-3D: Solder Paste Inspection & Measurement System with Data Collection & SPC Analysis AVM Series - Automated Dimensional Measurement Software I Systems' Wafer Inspection/Marking System. Increase your Probers Throughput, Import Electrical Test Data, Inspect Only the Die that Pass Test, Increase your Inspection Efficiency, Improve Data Collection and Analysis, Merge ...

A company serving the semiconductor industry and equipment makers worldwide ...