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Surface Measurement
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SPECS: XPS, LT-STM, MBE, LEED, EELS, Auger, ESCA, UPS, SIMS, PEEM
Instruments for surface science and UHV components for XPS, LT-STM, MBE, ESCA, LEED, EELS, Auger, UPS, SIMS, PEEM, LEEM, vacuum chambers, effusion cells, ECR plasma atom ion source, e-beam evaporator ...
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